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심포지움,특별강연 및 일반연제 발표 : 신증후군 환자에서 알부민 전처치가 Furosemide 이뇨효과에 미치는 약력학 및 약동학적 유용성 평가
나기영 ( Na Gi Yeong ),김강석 ( Kim Gang Seog ),김연수 ( Kim Yeon Su ),안규리 ( An Gyu Li ),한진석 ( Han Jin Seog ),김성권 ( Kim Seong Gwon ),이정상 ( Lee Jeong Sang ),배균섭 ( Bae Gyun Seob ),신상구 ( Sin Sang Gu ),허우성 ( Heo U 대한신장학회 2000 춘계학술대회 초록집 Vol.19 No.2
( Young Eun Chon ),( Dong Joon Kim ),( Sang Gyune Kim ),( In Hee Kim ),( Si Hyun Bae ),( Seong Gyu Hwang ),( Jeong Heo ),( Jeong Won Jang ),( Byung Seok Lee ),( Hyung Joon Kim ),( Dae Won Jun ),( Gang 대한간학회 2012 춘·추계 학술대회 (KASL) Vol.2012 No.1
Background: Until today, there is currently no data available on the efficacy, safety, and tolerability of pegylated interferon alfa 2a (PEG-IFNa-2a) in Korean patients with chronic hepatitis B (CHB), who are known to have mostly HBV genotype C. Methods: We collected data from 18 institutes of 451 Korean patients with CHB who were treated with PEG-IFNa-2a as a first line therapy (370 patients with HBeAg positive and 81 with HBeAg negative). Treatment responses at the end of treatment (ET) and at 6 months post-treatment (PT6) were compared between patients treated for 24 weeks vs. 48 weeks, and adverse events were evaluated. Results: In HBeAg-positive patients, the patients who had received PEG-IFNa-2a for 48 weeks than 24 weeks achieved significantly higher virological response (HBV DNA < 2,000 IU/mL) (48 vs. 24 weeks at ET, 44.4% vs. 27.2%, p = 0.005; at PT6, 46.7% vs. 17.2%, p=0.001). Complete virological response (HBV DNA < 60 IU/mL) at ET was also achieved in more patients with a longer treatment (48 vs. 24 weeks 22.0% vs. 13.0%, p=0.005). HBeAg seroconversion rate at ET was 18.1% with 48 weeks treatment, which is significantly higher than 10.1% (p=0.012) with 24 weeks treatment. This finding was continued to PT6 (23.7% vs. 17.2%, p = 0.028). The rate of ALT normalization was increased from 61.4% at ET to 76.8% at PT6 on 48 weeks-treatment. HBsAg seroconversion was not common (48 vs. 24 weeks at ET, 0.4% vs. 0%; at PT6, 0.8% vs. 0%). In HBeAg-negative patients, virologic response at ET was higher than that in HBeAg-positive patients following 48 weeks treatment (serum HBV DNA< 60 and < 2,000 IU/mL; 60.8% and 87.8%, respectively). HBsAg seroconversion was 1.4% at ET and it was maintained at PT6. Adverse events were typical of those associated with PEG-IFNa-2a. Conclusion: In Korean CHB patients, PEG-IFNa-2a showed substantial treatment response and good tolerability. In patients with HBeAg-positive CHB, the longer treatment of PEG-IFNa-2a (48 weeks rather than 24 weeks) was more efficacious with similar safety profiles.
김명균,강성호,한창호,민형복,Kim, Myeong-Gyun,Gang, Seong-Ho,Han, Chang-Ho,Min, Hyeong-Bok 대한전자공학회 2001 電子工學會論文誌-SD (Semiconductor and devices) Vol.38 No.4
빠른 반도체 기술의 발전으로 인하여 VLSI 회로의 복잡도는 크게 증가하고 있다. 그래서 복잡한 회로를 테스팅하는 것은 아주 어려운 문제로 대두되고 있다. 또한 집적회로의 증가된 집적도로 인하여 여러 가지 형태의 고장이 발생하게 됨으로써 테스팅은 더욱 중요한 문제로 대두되고 있다. 이제까지 일반적으로 지연 고장 테스팅에 대한 신뢰도는 가정된 고장의 개수에 대한 검출된 고장의 개수로 표현되는 전통적인 고장 검출율로서 평가되었다. 그러나 기존의 교장 검출율은 고장 존재의 유무만을 고려한 것으로써 실제의 지연 고장 테스팅에 대한 신뢰도와는 거리가 있다. 지연 고장 테스팅은 고착 고장과는 달리 경로의 진행 지연과 지연 결함 크기 그리고 시스템 동작 클럭 주기에 의존하기 때문이다. 본 논문은 테스트 중인 경로의 진행 지연과 지연 결함 크기를 고려한 새로운 고장 검출율 메트릭으로서지연 결함 고장 검출율(delay defect fault coverage)을 제안하였으며, 지연 결함 고장 검출율과 결함 수준(defect level)과의 관계를 분석하였다. Due to the rapid development of semiconductor technology, the complexity of VLSI circuits has heavily increased. With the increased densities of integrated circuits, several different types of faults can occur Thus, testing such circuits is becoming a sever problem. Delay testing can detect system timing failures caused by delay faults. However, the conventional delay fault coverage in terms of the number of detected faults may not be an effective measure of delay testing because, unlike a stuck-at-faults, the impact of a delay fault is dependent on its delay defect size rather than on its existence. Thus, the effectiveness of delay testing is dependent on the propagation delay of the path to be tested, the delay defect size, and the system clock interval. This paper proposes a new delay defect fault coverage that considers both propagation delay of the path to be tested and additional delay defect size. And the relationship between delay defect fault coverage and defect level is analyzed.
강진식,서유원,김태형,정성균,신용승,Gang, Jin-Sik,Seo, Yu-Won,Kim, Tae-Hyeong,Jeong, Seong-Gyun,Sin, Yong-Seung 대한기계학회 2002 大韓機械學會論文集A Vol.26 No.8
The effects of re-peening on the fatigue damaged material are studied in this paper. The effects of re-peening process on surface hardness, surface roughness, surface compressive residual stress, and fatigue life are investigated. The results can be summarized in brief as follows: The depth of hardening layer was increased by re-peening process. There is no large variation of the surface roughness by re-peening process. The compressive residual stress of shot-peened specimen decreases under the fatigue loading and then increases again by re-peening process. Re-peening process increases the fatigue lifo of shot-peened and fatigue damaged specimen. The increase of fatigue lift under high stress level is much higher than under low stress level.