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E-beam lithography and electrodeposition fabrication of thick nanostructured devices
Lo, T N,Chen, Y T,Chiu, C W,Liu, C J,Wu, S R,Lin, I K,Su, C I,Chang, W D,Hwu, Y,Shew, B Y,Chiang, C C,Je, J H,Margaritondo, G Institute of Physics [etc.] 2007 Journal of Physics. D, Applied Physics Vol.40 No.10
<P>A nanofabrication approach based on advanced e-beam lithography and electrodeposition successfully produced high-resolution (≈40 nm line width) metal structures with high aspect ratio (>12) and high density. The combination of these characteristics is essential for hard-x-ray optical components such as zone plates, for x-ray lithography masks and for other devices.</P>
Applying Multi-Oversampling to One-Comparator Counter-Based Sampling to Enhance System Stability
Y. T. Yau,K. I. Hwu,C. W. Wang,Jenn-Jong Shieh 전력전자학회 2019 ICPE(ISPE)논문집 Vol.2019 No.5
This paper presents a novel method to enhance the system stability of a digital controller for a switching power converter under one-comparator counter-based sampling based on higher sampling frequency. However, the sampling rate and the hardware are not changed. The measured results of the proposed strategy are presented to demonstrate this concept.
System Clock Reduction Based on Multiple Sampling for Digital Switching Power Supplies
Y. T. Yau,K. I. Hwu,W. Z. Jiang 전력전자학회 2015 ICPE(ISPE)논문집 Vol.2015 No.6
In this paper, the proposed sampling structure based on one-comparator sampling is presented, which can significantly reduce the system clock frequency from 100MHz to 25MHz, so as to reduce chip area. This method is verified by a synchronously-rectified buck converter with a switching frequency of 200kHz, and the digital controller takes as a control kernel the EP1C3T100 FPGA created by Altera Co., along with the VHDL language to program this controller.
A coherent synchrotron X-ray microradiology investigation of bubble and droplet coalescence
Weon, B. M.,Je, J. H.,Hwu, Y.,Margaritondo, G. International Union of Crystallography 2008 Journal of synchrotron radiation Vol.15 No.6
<▼1><P>Microradiology with coherent X-rays is shown to be very effective in revealing interfaces in multiphase systems and in particular gas bubbles. Its use has been tested in the study of bubble colescence validating the results with a simple theoretical analysis based on mass conservation.</P></▼1><▼2><P>A quantitative application of microradiology with coherent X-rays to the real-time study of microbubble and microdroplet coalescence phenomena, with specific emphasis on the size relations in three-body events, is presented. The results illustrate the remarkable effectiveness of coherent X-ray imaging in delineating interfaces in multiphase systems, in accurately measuring their geometric properties and in monitoring their dynamics.</P></▼2>
Detecting small lung tumors in mouse models by refractive-index microradiology
Chien, Chia-Chi,Zhang, Guilin,Hwu, Y.,Liu, Ping,Yue, Weisheng,Sun, Jianqi,Li, Yan,Xue, Hongjie,Xu, Lisa X.,Wang, Chang Hai,Chen, Nanyow,Lu, Chien Hung,Lee, Ting-Kuo,Yang, Yuh-Cheng,Lu, Yen-Ta,Ching, Y Springer-Verlag 2011 ANALYTICAL AND BIOANALYTICAL CHEMISTRY Vol.401 No.3
Advanced X-ray Microscopy in Materials and Biomedical Sciences
J.M. Yi,B.M. Weon,J.H. Je,Y. Hwu,G. Margaritondo 대한전자공학회 2008 ICEIC:International Conference on Electronics, Inf Vol.1 No.1
In recent years, x-ray microscopy has been literally revolutionized by the exploitation of the unique characteristics of synchrotron sources. In particular, the high spatial coherence of the radiation significantly contributes to the development of advanced and powerful xray microscopy. The results are very high quality microradiology and microtomograhy images and movies - taken with a limited x-ray dose ? that find a variety of applications in materials science, biology and medical research. In this talk we review basic theory and selected applications of phase contrast x-ray microscopy to materials and biomedical sciences. Furthermore we introduce a new strategy of combining phase contrast radiology and diffraction x-ray microscopy to visualize atomic level defects such as misfit dislocations and micropipes in semiconductor single crystals. Finally phase contrast x-ray imaging in nanometer-resolution (< 30 ㎚) will be demonstrated.