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은닉층 노드의 생성추가를 이용한 적응 역전파 신경회로망의 학습능률 향상에 관한 연구
김은원,홍봉화,Kim, Eun-Won,Hong, Bong-Wha 대한전자공학회 2002 電子工學會論文誌 IE (Industry electronics) Vol.39 No.2
본 논문에서는 역전파 신경회로망의 학습능률을 향상시키기 위한 방법으로 발생한 오차에 따라서 학습파라미터와 은닉층의 수를 적응적으로 변경시킬 수 있는 적응 역 전파 학습알고리즘을 제안하였다. 제안한 알고리즘은 역전파 신경회로망이 국소점으로 수렴하는 문제를 해결할 수 있고 최적의 수렴환경을 만들 수 있다. 제안된 알고리즘을 평가하기 위하여 배타적 논리합, 3-패리티 및 7${\times}$5 영문자 폰트의 학습을 이용하였다. 실험결과, 기존에 제안된 알고리즘들에 비하여 국소점에 빠지게 되는 경우가 감소하였고 약 17.6%~64.7%정도 학습능률이 향상하였다. This paper presents an adaptive back propagation algorithm that its able to enhancement for the learning efficiency with updating the learning parameter and varies the number of hidden layer node by the generated error, adaptively. This algorithm is expected to escaping from the local minimum and make the best environment for the convergence of the back propagation neural network. On the simulation tested this algorithm on three learning pattern. One was exclusive-OR learning and the another was 3-parity problem and 7${\times}$5 dot alphabetic font learning. In result that the probability of becoming trapped in local minimum was reduce. Furthermore, the neural network enhanced to learning efficient about 17.6%~64.7% for the existed back propagation.?
FPGA가 포함된 Board의 Open & Short Test 방법
김은원(Eun-Won Kim),박종진(Jong-Jin Park) 대한전자공학회 2015 대한전자공학회 학술대회 Vol.2015 No.6
Recently, Complexity of SoC(System on Chip) is increased, and Cost of Test is more higher relative importance per totality Cost. In reducing method for the cost of test, the test implementation of board level is studying for many researcher using FPGA device of low cost. FPGA device is have many I/O connection for the most DUT(Device Under Test). And, the diagnostic analysis is needed the test for manufactured goods. In this paper, Open & Short diagnostic method is represented for I/O pins of the test board using FPGA device.
김은원(Eun-Won Kim) 대한전자공학회 2021 대한전자공학회 학술대회 Vol.2021 No.6
A plan was proposed to induce vehicle deceleration using Flares and to prevent safety accidents in the school zone through driver awareness of the surrounding roads.
김은원(Eun Won - Kim) 대한전자공학회 2024 대한전자공학회 학술대회 Vol.2024 No.6
The differentiation of ozone generating devices presented in this paper is that it presents a new mechanism (heat pipe) that allows ozone concentrations to be produced more than 70% large at the same power consumption (50W). In other words, when using a high-frequency transformer to remove electrons while supplying high voltage, heat is generated in the electrode and dielectric, and if the heat is not lowered quickly, the discharge pipe will be damaged or destroyed. So this paper, presents a method of processing and using a heat pipe.
김은원(Eun-Won Kim),박종진(Jong-Jin Park) 대한전자공학회 2016 대한전자공학회 학술대회 Vol.2016 No.6
Recently, the complexity of the SoC (System on Chip) is constantly increasing. The cost of testing is increasingly a share of the total cost. The research into ways to reduce the cost of test for the implementation of board-level testing with low-cost FPGA devices is progressing a lot. FPGA devices have a number of I / O to a plurality of DUT (Device Under Test) connection, there is a trend to use in Test pattern data also increases. In this paper, we present a number of I / O and ways to efficiently process a large amount of test patterns for the device, and verify the function by using the FPGA device.