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Stable Topographic Imaging by Using a Nanoprism Probe with Sharp Edges
김태경 한국물리학회 2015 새물리 Vol.65 No.4
A nanoprism (NP)-terminated probe has been fabricated and used in an atomic force microscope (AFM) for stable topographic imaging. The NP-terminated probe has sharp edges that originate from the chemical lift-off process after the angled-grinding process. Energy dispersive X-ray (EDX) spectra show the presence of a Au metal film at the end of the silicon probe. We obtained highresolution imaging of single-walled carbon nanotubes (SWCNTs) by using the NP-terminated probe due to the sharp edges of the NP. Furthermore, we could estimate the radius of curvature of the NP-terminated probe by using the deconvolution equation. Our NP-terminated probes could be a powerful tool for basic research on surface analysis and for scanning probe microscopy applications.