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이수일(S. I. Lee),홍상혁(S. H. Hong),이장무(J. M. Lee),A.Raman,S.W.Howell,R.Reifenberger 대한기계학회 2003 대한기계학회 춘추학술대회 Vol.2003 No.11
Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe<br/> tip as it approaches and retracts from a sample to measure the topography and material properties of a<br/> nanostructure. We present recent results based on nonlinear dynamical systems theory, computational<br/> continuation techniques and detailed experiments that yield new perspectives and insight into AFM. A<br/> dynamic model including van der Waals and Derjaguin-Muller-Toporov (DMT) contact forces demonstrates<br/> that periodic solutions can be represented with respect to the approach distance and excitation frequency.<br/> Turning points on the surface lead to hysteretic amplitude jumps as the tip nears/retracts from the sample.<br/> Experiments are performed using a tapping mode tip on a graphite sample to verify the predictions.