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필드 플레이트가 설계된 다이아몬드 쇼트키 장벽 다이오드
장해녕(Hae Nyung Chang),강동원(Dong-Won Kang),하민우(Min-Woo Ha) 대한전기학회 2017 전기학회논문지 Vol.66 No.4
Power semiconductor devices required the low on-resistance and high breakdown voltage. Wide band-gap materials opened a new technology of the power devices which promised a thin drift layer at an identical breakdown voltage. The diamond had the wide band-gap of 5.5 eV which induced the low power loss, high breakdown capability, low intrinsic carrier generation, and high operation temperature. We investigated the p-type pseudo-vertical diamond Schottky barrier diodes using a numerical simulation. The impact ionization rate was material to calculating the breakdown voltage. We revised the impact ionization rate of the diamond for adjusting the parallel-plane breakdown field at 10 MV/cm. Effects of the field plate on the breakdown voltage was also analyzed. A conventional diamond Schottky barrier diode without field plate exhibited the high forward current of 0.52 A/㎜ and low on-resistance of 1.71 Ω-㎜ at the forward voltage of 2 V. The simulated breakdown field of the conventional device was 13.3 MV/㎝. The breakdown voltage of the conventional device and proposed devices with the SiO₂ passivation layer, anode field plate (AFP), and cathode field plate (CFP) was 680, 810, 810, and 1020 V, respectively. The AFP cannot alleviate the concentration of the electric field at the cathode edge. The CFP increased the breakdown voltage with evidences of the electric field and potential. However, we should consider the dielectric breakdown because the ideal breakdown field of the diamond is higher than that of the SiO₂, which is widely used as the passivation layer. The real breakdown voltage of the device with CFP decreased from 1020 to 565 V due to the dielectric breakdown.
Numerical simulation of p-type diamond Schottky barrier diodes for high breakdown voltage
Kang, Dong-Won,Chang, Hae Nyung,Ha, Min-Woo Institute of Pure and Applied Physics 2017 Japanese Journal of Applied Physics Vol. No.
<P>P-type diamond devices have high potential for power semiconductors due to their high critical field, hole mobility, and thermal conductivity. The electrical characteristics of p-type pseudovertical diamond Schottky barrier diodes (SBDs) were investigated by numerical simulation. The impact ionization coefficients were required to obtain the breakdown voltage. They were revised to satisfy a parallel-plane breakdown field of 10MV/cm. The doping concentration and thickness of a low-doped drift layer were key parameters in determining the parallel-plane breakdown voltage. The p-type pseudovertical diamond SBDs exhibited lower breakdown voltage than the parallel-plane breakdown voltage because field crowding occurred at the edge of the cathode. When the doping concentration and thickness of the p- drift layer were 10(16)cm(-3) and 4 mu m, respectively, the breakdown voltage of the p-type pseudovertical diamond SBD was 961V, which was considerably less than the parallel-plane breakdown voltage of 3646V. (C) 2017 The Japan Society of Applied Physics</P>