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Sang-Mook Kim,Hwa Sub Oh,Jong Hyeob Baek,Kwang-Ho Lee,Gun Young Jung,Jae-Ho Song,Ho-Jong Kim,Byung-Jun Ahn,Dong Yanqun,Jung-Hoon Song IEEE 2010 IEEE electron device letters Vol.31 No.8
<P>The strain and piezoelectric fields in InGaN blue light-emitting diodes on a GaN layer, which is grown on a planar sapphire substrate or patterned sapphire substrates (PSSs), such as a microsized PSS and a nanosized PSS (NPSS), are investigated by micro-Raman spectroscopy and electroreflectance (ER) spectroscopy. The obtained piezoelectric field in InGaN multiple quantum wells (QWs) grown on the planar substrate is 0.83 MV/cm, and it is 0.70 MV/cm for the case of the NPSS. These results are attributed to the fact that the GaN layers on the PSSs have a smaller residual strain compared to that on the planar sapphire, and thus, strain reduction in the GaN layer can reduce the piezoelectric field in the InGaN QWs grown on top of it.</P>
Silicone-Based Adhesives with Highly Tunable Adhesion Force for Skin-Contact Applications
Lee, Bong Kuk,Ryu, Jin Hwa,Baek, In-Bok,Kim, Yarkyeon,Jang, Won Ick,Kim, Sang-Hyeob,Yoon, Yong Sun,Kim, Seung Hwan,Hong, Seong-Gu,Byun, Sangwon,Yu, Han Young Wiley (John WileySons) 2017 Advanced healthcare materials Vol.6 No.22
Transport Properties of Ramp-Edge Junction with Columnar Defects
Lee, C. W.,Kim, D. H.,Lee, T. W.,Sung, Gun-Yong,Kim, Sang-Hyeob The Korean Superconductivity Society 2001 Progress in superconductivity Vol.3 No.1
We measured the transport properties of$ YBa_2$$Cu_3$$O_{x}$ ramp-edge junction fabricated with interface-engineered barrier. The current-voltage characteristics show a typical resistively-shunted junction like behavior Voltage noise measurement revealed that the main source of the 1/f noise is the critical current and resistance fluctuations. The analysis of the noise data showed that the critical current fluctuations increase with temperature, whereas the resistance fluctuations are almost constant, and both fluctuations are almost correlated. The smaller magnitude of the critical current and resistance fluctuations seems to result from the columnar-deflects.s.