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https://www.riss.kr/link?id=O120574036
2023년
eng
0277-786X
1996-756X
학술저널
Proceedings of SPIE, the International Society for Optical Engineering
124963G-124963G [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
9781510660991
Metrology, Inspection, and Process Control XXXVII
San Jose, California, United States
0
상세조회0
다운로드
Optimizations of APC multivariate algorithm for linear mix and match overlay control
Investigation of device overlay variation and control metrology in 3D-NAND process
Precise 3D profile measurement of high aspect ratio device patterns by small-angle x-ray scattering