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https://www.riss.kr/link?id=O37272102
2001년
eng
0584-8547
1873-3565
SCI;SCIE;SCOPUS
학술저널
SPECTROCHIMICA ACTA PART B
2107-2116 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
Total reflection x-ray fluorescence analysis and related methods
Conference; 8th
Vienna
2000; Sep
0
상세조회0
다운로드
Total-reflection X-ray fluorescence moving towards nanoanalysis: a survey
Total reflection X-ray fluorescence study of organic nanostructures
Detection limit calculations for the total reflection techniques of X-ray fluorescence analysis
Determination of concentration distribution of trace elements near the detection limit