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      터널링 특성을 이용한 새로운 구조의 실리콘 태양전지 = A new silicon solar cells using the tunneling dielectric material characteristics

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      https://www.riss.kr/link?id=A99589308

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      다국어 초록 (Multilingual Abstract)

      A new structure of the silicon solar cells with the tunneling phenomenon through a very thin dielectric film was fabricated by screen printing method. From the I-V characteristics of the MIS capacitors with a 2 nm of thin film, electrons that were accumulated on the silicon surface were confirmed to pass by tunneling to the front electrode through the very thin Al2O3 film. A good C-V interface characteristic of the MIS capacitors was observed. Although the efficiency of the fabricated silicon solar cell with passivated tunneling Al2O3 film thickness of 2 nm was 3.15%, expected results are to be improved by the optimization of the solar cell processes parameters and cell design.
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      A new structure of the silicon solar cells with the tunneling phenomenon through a very thin dielectric film was fabricated by screen printing method. From the I-V characteristics of the MIS capacitors with a 2 nm of thin film, electrons that were acc...

      A new structure of the silicon solar cells with the tunneling phenomenon through a very thin dielectric film was fabricated by screen printing method. From the I-V characteristics of the MIS capacitors with a 2 nm of thin film, electrons that were accumulated on the silicon surface were confirmed to pass by tunneling to the front electrode through the very thin Al2O3 film. A good C-V interface characteristic of the MIS capacitors was observed. Although the efficiency of the fabricated silicon solar cell with passivated tunneling Al2O3 film thickness of 2 nm was 3.15%, expected results are to be improved by the optimization of the solar cell processes parameters and cell design.

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