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https://www.riss.kr/link?id=O40641238
1995년
eng
1063-6722
학술저널
IEEE INTERNATIONAL WORKSHOP ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS
19-27 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0818671076; 0818673826
Defect and fault tolerance in VLSI systems
International workshop
Lafayette; LA
1995; Nov
0
상세조회0
다운로드
Approximation of Critical Area of ICs with Simple Parameters Extracted from the Layout
AFFCCA: A Tool for Critical Area Analysis with Circular Defects and Lithography Deformed Layout
Hierarchical Critical Area Extraction with the EYE tool
Wafer-Scale Integration Defect Avoidance Tradeoffs between Laser Links and Omega Network Switching