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https://www.riss.kr/link?id=O39027495
1993년
eng
surface science ; electronic materials ; IVC ; ICSS ; NEVAC
0169-4332
1873-5584
SCI;SCIE;SCOPUS
학술저널
APPLIED SURFACE SCIENCE
573-577 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
Applications of surface science and electronic materials
Pt B; Electronic materials and processing
Session; 12th International vacuum congress
The Hague
1992; Oct
0
상세조회0
다운로드
AES and XPS measurements: reducing the uncertainty and improving the accuracy
Approaching the limits of high resolution depth profiling
Diffraction effects in Auger quantitative analysis on III-V compounds
A fast method for the simulation of XPS and AES spectra