Analytic expressions are presented that accurately represent the dielectric functions ε ¼ ε1 þ iε2 of In1xGaxSb from 1.5 to 6 eV. We used the parametric model, which portrays ε as a sum of polynomials and can accommodate the asymmetric nature of...
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https://www.riss.kr/link?id=A104239360
2014
English
KCI등재,SCOPUS,SCIE
학술저널
768-771(4쪽)
2
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
Analytic expressions are presented that accurately represent the dielectric functions ε ¼ ε1 þ iε2 of In1xGaxSb from 1.5 to 6 eV. We used the parametric model, which portrays ε as a sum of polynomials and can accommodate the asymmetric nature of...
Analytic expressions are presented that accurately represent the dielectric functions ε ¼ ε1 þ iε2 of In1xGaxSb from 1.5 to 6 eV. We used the parametric model, which portrays ε as a sum of polynomials and can accommodate the asymmetric nature of critical point transitions. The ε spectra were obtained previously by spectroscopic ellipsometry for x ¼ 0.000, 0.102, 0.305, 0.473, 0.684, and 1.000.
The ε data are successfully reconstructed and parameterized by eight polynomials. With the interpolation of parameters of ε spectra, we can determine ε as a continuous function of Ga composition and energy over the entire composition range 0 x 1. These results should be useful for device design and in situ monitoring of deposition.
참고문헌 (Reference)
1 K. Takei, 12 : 2060-2066, 2012
2 T. F. Refaat, 43 : 1014-1015, 2004
3 S. Imai, 32 : 3860-3865, 1993
4 T. J. Kim, 102 : 102109-, 2013
5 D. E. Aspnes, 27 : 985-1009, 1983
6 B. Johs, 313 : 137-142, 1998
7 T. J. Kim, 112 : 013505-, 2012
8 Y.S. Ihn, 455 : 222-227, 2004
9 T. J. Kim, 68 : 115323-, 2003
10 "WVASE32" J.A. Woollam Co., Inc., USA
1 K. Takei, 12 : 2060-2066, 2012
2 T. F. Refaat, 43 : 1014-1015, 2004
3 S. Imai, 32 : 3860-3865, 1993
4 T. J. Kim, 102 : 102109-, 2013
5 D. E. Aspnes, 27 : 985-1009, 1983
6 B. Johs, 313 : 137-142, 1998
7 T. J. Kim, 112 : 013505-, 2012
8 Y.S. Ihn, 455 : 222-227, 2004
9 T. J. Kim, 68 : 115323-, 2003
10 "WVASE32" J.A. Woollam Co., Inc., USA
11 C.M. Herzinger, "U.S. Patent No. 5,796,983"
12 M. Cardona, "Modulation Spectroscopy" Academic Press 9-23, 1969
학술지 이력
연월일 | 이력구분 | 이력상세 | 등재구분 |
---|---|---|---|
2023 | 평가예정 | 해외DB학술지평가 신청대상 (해외등재 학술지 평가) | |
2020-01-01 | 평가 | 등재학술지 유지 (해외등재 학술지 평가) | |
2008-01-01 | 평가 | 등재학술지 선정 (등재후보2차) | |
2007-01-01 | 평가 | 등재후보 1차 PASS (등재후보1차) | |
2003-01-01 | 평가 | 등재후보학술지 선정 (신규평가) |
학술지 인용정보
기준연도 | WOS-KCI 통합IF(2년) | KCIF(2년) | KCIF(3년) |
---|---|---|---|
2016 | 1.8 | 0.18 | 1.17 |
KCIF(4년) | KCIF(5년) | 중심성지수(3년) | 즉시성지수 |
0.92 | 0.77 | 0.297 | 0.1 |