IEEE 1500 표준 기반의 효율적인 프로그램 가능한 메모리 BIST

참고문헌 (Reference)

1 A. W. Hakmi, "Programmable deterministic Built-In Self-Test" 1-9, 2007

2 S. Hamdioui, "March SS: a test for all static simple RAM faults" 95-100, 2002

3 Y. Park, "IEEE std. 1500 based Programmable Memory Built-In Self-Test(BIST) for Embedded Memory in SoC" 2012

4 IEEE Computer Society, "IEEE Standard Testability Method for Embedded Core-based Integrated Circuits"

5 IEEE Computer Society, "IEEE Standard Test Access Port and Boundary-Scan Architecture"

6 A. van de Goor, "Generic, Orthogonal and Low-cost March Element based Memory BIST" 1-10, 2011

7 Yamasaki, I. Suzuki, "External memory BIST for system-in-package" 1145-1154, 2005

8 D. Appello, "Exploiting Programmable BIST for the Diagnosis of Embedded Memory Cores" 379-385, 2003

9 W. L. Wang, "An on-chip march pattern generator for testing embedded memory cores" 9 (9): 730-735, 2001

10 Y. Park, "An Effective Programmable Memory BIST for Embedded Memory" 92 (92): 2508-2511, 2009

11 X. Du, "A Field Programmable Memory BIST Architecture Supporting Algorithms with Multiple Nested Loops" 287-292, 2006