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AFM Characterization of Copper Dendritic Growths in Integrated Electronic Microcircuits
Gabrielli, C.; Mace, C.; Ostermann, E.; Pailleret, A. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.D5-D8
Air Exposure Effect on LiFePO~4
Martin, J.F.; Yamada, A.; Kobayashi, G.; Nishimura, S.-i.; Kanno, R.; Guyomard, D.; Dupre, N. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.A12-A16
Characteristics of W-Doped (Pb~0~.~8Sr~0~.~2)TiO~3 Thin Films
Chen, H.-Y.; Wu, J.-M. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.G1-G3
Characterization of Oxide Scale on Alloy 446 by X-Ray Nanobeam Analysis
Zeng, Z.; Natesan, K.; Cai, S.B. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.C5-C8
Conformal Deposition of Ni-P on Anodic Aluminum Oxide Template
Lin, S.-C.; Lai, C.-H.; Wu, P.-W. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.D1-D4
Current Transport Mechanism for HfO~2 Gate Dielectrics with Fluorine Incorporation
Wu, W.C.; Lai, C.S.; Wang, T.M.; Wang, J.C.; Hsu, C.W.; Ma, M.W.; Chao, T.S. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.H15-H18
Cu Surface Morphology Evolution during Electropolishing
Shivareddy, S.; Bae, S.E.; Brankovic, S.R. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.D13-D17
Direct Ascorbic Acid Detection with Ferritin Immobilized on Single-Walled Carbon Nanotubes
Dechakiatkrai, C.; Chen, J.; Lynam, C.; Shin, K.M.; Kim, S.J.; Phanichphant, S.; Wallace, G.G. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.K4-K6
Effect of UV Irradiation on Threshold Voltage and Subthreshold Slope in Pentacene TFT
Kim, W.-K.; Lee, J.-L. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.H4-H6
Efficiency Enhancement of Field-Emission Organic Light Emitting Diodes Using a Dynode Structure
Li, C.-S.; Yokoyama, M.; Su, S.-H. ELECTROCHEMICAL SOCIETY AND INSTITUTE OF ELECTRONICS ENGINEERS 2008 p.J1-J3