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https://www.riss.kr/link?id=O49512654
2008년
eng
1605-7422
2410-9045
학술저널
PROCEEDINGS - SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
6884 07 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0819470597
Reliability, packaging, testing, and characterization of MEMS/MOEMS
Conference; 7th
Reliability, testing and characterization of MEMS/MOEMS VI
San Jose, Calif.
2008; Jan
0
상세조회0
다운로드
MEMS reliability: coming of age [6884-30]
Understanding and improving longevity in RF MEMS capacitive switches (Invited Paper) [6884-01]
Experimental study of electrical breakdown in MEMS devices with micrometer scale gaps [6884-02]
Degradation evaluation of microelectromechanical thermal actuators [6884-03]