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      KCI등재 SCIE

      High-precision Positioning Stage using Optical Zooming Laser Interferometer for Linear Encoder Calibration

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      https://www.riss.kr/link?id=A104359504

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      다국어 초록 (Multilingual Abstract)

      A high-resolution positioning system for linear encoder calibration was developed. The optical sources were stabilized to a femtosecond optical comb for high accuracy and direct traceability to the optical frequency comb. This system showed a control ...

      A high-resolution positioning system for linear encoder calibration was developed. The optical sources were stabilized to a femtosecond optical comb for high accuracy and direct traceability to the optical frequency comb.
      This system showed a control resolution of 17 pm by using an optical zooming interferometer. The stability of the stage was 4.5 nm at 200 seconds, which can be improved by easy modification of optical setup and lasers.

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      참고문헌 (Reference)

      1 Keem, T, "Simple, real-time method for removing the cyclic error of homodyne interferometer with a quadrature detector system" 44 (44): 3492-3498, 2005

      2 Bobroff, N, "Recent advances in displacement measuring interferometry" 4 (4): 907-926, 1993

      3 Gonda, S, "Real-time,interferometrically measuring atomic force microscope for direct calibration on standards" 70 (70): 3362-3368, 1999

      4 Howard, L, "Real-time displacement measurements with a Fabry-Perot cavity and a diode laser" 25 (25): 321-335, 2001

      5 Kajima, M, "Picometer positioning system based on a zooming interferometer using a femtosecond optical comb" 16 (16): 1497-1506, 2008

      6 Wu, C. M, "Nonlinearity in measurements of length by optical interferometry" 7 (7): 62-68, 1996

      7 Lawall, J, "Michelson interferometry with 10 pm accuracy" 71 (71): 2669-2676, 2000

      8 Chassagne, L, "Highly accurate positioning control method for piezoelectric actuators based on phase-shifting optoelectronics" 16 (16): 1771-1777, 2005

      9 Matsumoto, H, "High-accuracy ultrastable moving stage using a novel self-zooming optical scale" 132 (132): 417-420, 1996

      10 Zhao, Y, "Dual-wavelength parallel interferometer with superhigh resolution" 27 (27): 503-505, 2002

      1 Keem, T, "Simple, real-time method for removing the cyclic error of homodyne interferometer with a quadrature detector system" 44 (44): 3492-3498, 2005

      2 Bobroff, N, "Recent advances in displacement measuring interferometry" 4 (4): 907-926, 1993

      3 Gonda, S, "Real-time,interferometrically measuring atomic force microscope for direct calibration on standards" 70 (70): 3362-3368, 1999

      4 Howard, L, "Real-time displacement measurements with a Fabry-Perot cavity and a diode laser" 25 (25): 321-335, 2001

      5 Kajima, M, "Picometer positioning system based on a zooming interferometer using a femtosecond optical comb" 16 (16): 1497-1506, 2008

      6 Wu, C. M, "Nonlinearity in measurements of length by optical interferometry" 7 (7): 62-68, 1996

      7 Lawall, J, "Michelson interferometry with 10 pm accuracy" 71 (71): 2669-2676, 2000

      8 Chassagne, L, "Highly accurate positioning control method for piezoelectric actuators based on phase-shifting optoelectronics" 16 (16): 1771-1777, 2005

      9 Matsumoto, H, "High-accuracy ultrastable moving stage using a novel self-zooming optical scale" 132 (132): 417-420, 1996

      10 Zhao, Y, "Dual-wavelength parallel interferometer with superhigh resolution" 27 (27): 503-505, 2002

      11 Schibli, T. R, "Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength systhesizer" 14 (14): 5984-5993, 2006

      12 Basile, G, "Combined optical and X-ray interferometry for high-precision dimensional metrology" 456 : 701-729, 2000

      13 Wu, C. M, "Analytical modeling of the periodic nonlinearity in heterodyne interferometry" 37 (37): 6696-6700, 1998

      14 Bitou, Y, "Accurate widerange displacement measurement using tunable diode laser and optical frequency comb generator" 14 (14): 644-654, 2006

      15 Ahn, J, "A passive method to compensate nonlinearity in a homodyne interferometer" 17 (17): 23299-23308, 2009

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-06-23 학회명변경 영문명 : Korean Society Of Precision Engineering -> Korean Society for Precision Engineering KCI등재
      2006-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2005-05-30 학술지명변경 한글명 : 한국정밀공학회 영문논문집 -> International Journal of the Korean of Precision Engineering KCI등재후보
      2005-05-30 학술지명변경 한글명 : International Journal of the Korean of Precision Engineering -> International Journal of Precision Engineering and Manufacturing
      외국어명 : International Journal of the Korean of Precision Engineering -> International Journal of Precision Engineering and Manufacturing
      KCI등재후보
      2005-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2003-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 1.38 0.71 1.08
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.92 0.85 0.583 0.11
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