http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
https://www.riss.kr/link?id=O39302171
1993년
eng
학술저널
INTERNATIONAL CONFERENCE ON QUALITY IN ELECTRONIC COMPONENTS
127-134 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
Quality in electronic components: failure prevention, detection and analysis
6th International conference
Bordeaux; France
1993; Oct
0
상세조회0
다운로드
Limitations in NIST test-structures when used for electromigration tests of bamboo metal lines
PRES - A circuit simulator with built-in reliability model for hot-carrier degradation
Investigations of hot electron effects at very low voltages for future thin film SOI application