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Semiconductor heterostructures and device structures investigated by photoreflectance spectroscopy
Misiewicz, J.; Sitarek, P.; Sek, G.; Kudrawiec, R. DARBA SOFIA 2003 p.263-318
Combined SNOM/AFM microscopy with micromachined nanoapertures
Radojewski, J.; Grabiec, P. DARBA SOFIA 2003 p.319-332
Application of electrostatic force microscopy in nanosystem diagnostics
Gotszalk, T.; Grabiec, P.; Rangelow, I. W. DARBA SOFIA 2003 p.333-338
Thermal characterization of copper thin films made by means of sputtering
Szeloch, R. F.; Posadowski, W. M.; Gotszalk, T. P.; Janus, P.; Kowaliw, T. DARBA SOFIA 2003 p.339-344
Wavelet shrinkage-based noise reduction from the high resolution X-ray images of epitaxial layers
Kozlowski, J.; Serafinczuk, J.; Kozik, A. DARBA SOFIA 2003 p.345-356
Hydrogenation process of Gd~3Ni
Tristan, N. V.; Palewski, T.; Drulis, H.; Folcik, L.; Nikitin, S. A. DARBA SOFIA 2003 p.357-361