전자 빔 조사 민감 물질의 전자회절분석을 위한 Imaging Plate 기술 = Imaging Plate Technique for the Electron Diffraction Study of a Radiation-sensitive Material under Electron Beam

국문 초록 (Abstract)

전자 빔 조사 민감 물질인 gibbsite (γ-Al(OH)₃)의 전자 빔 조사 상전이 연구에서 전자회절 자료의 기록에 대한 imaging plate 와 필름의 기록 특성을 실험적으로 비교하였다. Imaging plate는 극단적으로 낮은 전자 강도와 높은 전자 강도를 동시 기록하기에 충분한 선형 dynamic range를 갖기 때문에, 매우 낮은 전자조사 조건 (≤0.1 e-/μm²)에서 전자 회절 자료를 기록할 때 필름에 비해 회절 자료의 spatial frequency 범위가 두 배 이상 확장되었다. 심지어 이미 기록 포화된 투과 빔 주위의 신호 정보 레벨을 세분화하는 데에도 훨씬 우수한 분해 성능을 나타내었다. 따라서 본 연구 결과는 imaging plate가 극단적으로 낮은 전자강도 기록이 필요한 전자 빔 조사 민감 물질이나 cryo-biological 시편들의 구조 연구 관점에서 가장 적절한 기록 매체임을 나타낸다.

다국어 초록 (Multilingual Abstract)

An experimental comparison of the detection properties between imaging plate and film for recording the electron diffraction pattern was carried out on a radiation-sensitive material, an aluminum trihydroxide (gibbsite, γ-Al(OH)₃), through the electron beam irradiation. Because the imaging plate has a wide dynamic range sufficient for recording extremely low- and high-electron intensities, the range of spatial frequency for the diffraction pattern acquired by the imaging plate was extended to two times larger than the range by the film, especially at a low electron dose condition (≤0.1 e-/μm²). It is also demonstrated that the imaging plate showed better resolving power for discriminating fine intensity levels even in saturated transmitted beam. Hence, in the respect of investigating the structures of radiation-sensitive materials and cryobiological specimens, our experimental demonstrations suggest that the imaging plate technique may be a good choice for those studies, which have to use an extremely low electron intensity for recording.

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