1 Blackburn, D.L, "Power MOSFET failure revisited" 681-688, 1988
2 Singh, P, "Power MOSFET failure mechanisms" 499-502, 2004
3 Busatto, G., "Nondestructive testing of power MOSFET's failures during reverse recovery of drain-source diode" 593-599, 1996
4 Chang-Gyum Kim, "Modeling of CCFL using lamp delay and stability analysis of backlight inverter for large size LCD TV" 1751-1757, 2005
5 Fiel, A., "MOSFET failure modes in the zero-voltage-switched full-bridge switching mode power supply applications" 1247-1252, 2001
6 Aigner, H., "Improving the full-bridge phase-shift ZVT converter for failure-free operation under extreme conditions in welding and similar applications" 1341-1348, 1998
7 Cester, A., "Collapse of MOSFET drain current after soft breakdown" 4 : 63-72, 2004
8 Jung, Jeesung, "Analysis of the MOSFET Failure In a Junction-Isolated Power Integrated Circuit" 249-252, 2007
1 Blackburn, D.L, "Power MOSFET failure revisited" 681-688, 1988
2 Singh, P, "Power MOSFET failure mechanisms" 499-502, 2004
3 Busatto, G., "Nondestructive testing of power MOSFET's failures during reverse recovery of drain-source diode" 593-599, 1996
4 Chang-Gyum Kim, "Modeling of CCFL using lamp delay and stability analysis of backlight inverter for large size LCD TV" 1751-1757, 2005
5 Fiel, A., "MOSFET failure modes in the zero-voltage-switched full-bridge switching mode power supply applications" 1247-1252, 2001
6 Aigner, H., "Improving the full-bridge phase-shift ZVT converter for failure-free operation under extreme conditions in welding and similar applications" 1341-1348, 1998
7 Cester, A., "Collapse of MOSFET drain current after soft breakdown" 4 : 63-72, 2004
8 Jung, Jeesung, "Analysis of the MOSFET Failure In a Junction-Isolated Power Integrated Circuit" 249-252, 2007