OLED 패널의 기준패턴과 증착패턴의 크기 측정을 위한 패턴 동시 측정 시스템의 구현 = Implementing a Simultaneous Pattern Measurement System for Measuring the Size of the Standard Pattern and the Deposition Pattern of an OLED Panel

다국어 초록 (Multilingual Abstract)

Simultaneous pattern measurement system is new research subject for OLED panel inspection. It is defect inspection of OLED panel after deposition. This research suggests the system that calculates the size and center point of each patterns after obtaining standard and deposition pattern as one image. This system could be applied to OLED　manufacturing process. The research result shows that the size and center point of each patterns could be obtained by displaying the standard pattern and deposition pattern in one image.

참고문헌 (Reference)

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