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https://www.riss.kr/link?id=O57642221
2011년
eng
1938-5862
1938-6737
학술저널
ECS TRANSACTIONS
103-108 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
9781566779005
Microelectronics Technology and Devices
Conference
2011
0
상세조회0
다운로드
(Invited) Random Telegraph Noise: From a Device Physicist's Dream to a Designer's Nightmare
(Invited) Radiation Hardness of SiGe and Ge-Based CMOS Technologies
Quantum Hall Effect as an Electrical Resistance Standard
Comparison between SOI nMOSFET's under Uniaxial and Biaxial Mechanical Stress in Analog Applications