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https://www.riss.kr/link?id=O54748951
Van Elshocht, S. ; Adelmann, C. ; Popovici, M. ; Swerts, J. ; Delabie, A. ; Nyns, L. ; Shi, X. ; Tielens, H. ; Brijs, B. ; Pourtois, G.
2010년
eng
1938-5862
1938-6737
학술저널
ECS TRANSACTIONS
155-164 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
9781566777919
Advanced gate stack, source/drain, and channel engineering for si-based CMOS: new materials, processes, and equipment
International Symposium; 6th
Vancouver, Canada
2010; Apr
0
상세조회0
다운로드
(Invited) Silicon Photonics Technologies for Monolithic Electronic-Photonic Integrated Circuit
(Invited) Scaling FETs to 10 nm: Coulomb Effects, Source Starvation, and Virtual Source