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https://www.riss.kr/link?id=O105230285
2020년
eng
0026-2714
1872-941X
SCI;SCIE;SCOPUS
학술저널
Microelectronics and reliability
0
상세조회0
다운로드
Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modules
Challenges to overcome breakdown limitations in lateral β-Ga2O3 MOSFET devices
Reliable endpoint technique on Si trenching for backside circuit edit
A method to determine critical circuit blocks for electromigration based on temperature analysis