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https://www.riss.kr/link?id=O37219527
1990년
eng
0376-0308
학술저널
ADVANCES IN X RAY ANALYSIS
669-678 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0306440032
Advances in X-ray analysis
39th Annual conference on applications of X-ray analysis
Denver; CO
1990; Jul
0
상세조회0
다운로드
Recent Developments and Results in Total Reflection X-Ray Fluorescence Analysis
Glancing Angle X-Ray Absorption Spectroscopy
Semiconductor Surface Characterization by Synchrotron X-Ray Fluorescence Analysis
Total-Reflection X-Ray Fluorescence of Thin Layers on and in Solids