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Identification and Control of an Industrial Polymerization Process
Mourue, G.; Descamps, P.; Dochain, D.; Wertz, V. Published for the International Federation of Automatic Control by Pergamon 2002 p.1-6
Multi-Loop Controllers Using Wavelet Packet Decomposition for Film Processes
Hashimoto, Y.; Urase, K.; Itoh, T.; Hamaguchi, T.; Togari, Y.; Maki, H.; Yasutomo, N. Published for the International Federation of Automatic Control by Pergamon 2002 p.7-12
Processing of Semiconductor Quartz Photomarks on Bake-Plates
Ho, W. K.; Tay, A.; Lim, K. W. Published for the International Federation of Automatic Control by Pergamon 2002 p.13-18
On Control of Resist Film Uniformity in the Microlithography Process
Ho, W. K.; Lee, L. L.; Schaper, C. Published for the International Federation of Automatic Control by Pergamon 2002 p.19-24
A Hybrid Automaton Representation of Simulated Moving Bed Processes
Kleinert, T.; Lunze, J. Published for the International Federation of Automatic Control by Pergamon 2002 p.25-30
Neural Network-Based Identification and MPC Control of SMB Chromatography
Wang, C.; Engell, S.; Hanisch, F. Published for the International Federation of Automatic Control by Pergamon 2002 p.31-36
On-Line Payload Determination of a Moving Loader Using Neural Networks
Savia, M.; Koivo, H. Published for the International Federation of Automatic Control by Pergamon 2002 p.37-42
Modeling and Predictive Control of Cement Grinding Circuits
Lepore, R.; Wouwer, A. V.; Remy, M. Published for the International Federation of Automatic Control by Pergamon 2002 p.43-48
A Decoupling Grinding Circuit Control System
Hauksdottir, A. S.; Ierapetritou, M.; Jamsa-Jounela, S.-L.; Zuhlke, U. Published for the International Federation of Automatic Control by Pergamon 2002 p.49-54
Industrial Flotation Process Modelling: RTD Measurement by Radioactive Tracer Technique
Yianatos, J.; Diaz, F.; Rodriguez, J. Published for the International Federation of Automatic Control by Pergamon 2002 p.55-60