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      Analysis of 5 nm Circular and Trapezoidal Nanowires by using Three-dimensional Simulations

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      https://www.riss.kr/link?id=A105130707

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      다국어 초록 (Multilingual Abstract)

      As complementary metal-oxide semiconductor (CMOS) technologies move to below 10 nm due to aggressive scaling, a new device structure is required to increase gate controllability for mitigating short- channel effects (SCEs). In this study, a 3D technol...

      As complementary metal-oxide semiconductor (CMOS) technologies move to below 10 nm due to aggressive scaling, a new device structure is required to increase gate controllability for mitigating short- channel effects (SCEs). In this study, a 3D technology computer-aided design (TCAD) tool is used to analyze three different channel shapes of gateall- around (GAA) nanowires: circular, square, and trapezoidal. Simulation results show that the trapezoidal channel shape provides the maximum on-current from among the three shapes for the same cross-sectional area. In addition, the trapezoidal nanowire shows the minimum leakage current. In the trapezoidal shape, more benefits in both on- and offcurrent are expected when the ratio between top and bottom widths increases. Carrier density profiles in TCAD simulations reveal that the current variation is due to the channel shape and the electrical property of the channel.

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      목차 (Table of Contents)

      • Abstract
      • 1. Introduction
      • 2. General Simulation Setup
      • 3. Square vs. Trapezoidal Nanowires
      • 4. Circular vs. Trapezoidal Nanowires
      • Abstract
      • 1. Introduction
      • 2. General Simulation Setup
      • 3. Square vs. Trapezoidal Nanowires
      • 4. Circular vs. Trapezoidal Nanowires
      • 5. Conclusion
      • References
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      참고문헌 (Reference)

      1 G. Larrieu, "Vertical nanowire array-based field effect transistors for ultimate scaling" 5 (5): 2437-2441, 2013

      2 E. J. Nowak, "Turning silicon on its edge [double gate CMOS/FinFET technology]" 20 (20): 20-31, 2004

      3 M. Bohr, "The evolution of scaling from the homogeneous era to the heterogeneous era" 1-1, 2011

      4 "Sentaurus, ver. M-2016"

      5 "Sentaurus Application note, [Online]"

      6 D. E. Nikonov, "Overview of beyond-CMOS devices and a uniform methodology for their benchmarking" 101 (101): 2498-2533, 2013

      7 "ITRS 2.0 2015, Beyond CMOS, [Online]"

      8 Y. Taur, "Fundamental of Modern VLSI Devices" Cambridge Univ. Press 2013

      9 R. Huang, "Challenges of 22 nm and beyond CMOS technology" 52 (52): 1491-1533, 2009

      10 H. M. Fahad, "Are nanotube architectures more advantageous than nanowire architectures for field effect transistors?" 2 (2): 2012

      1 G. Larrieu, "Vertical nanowire array-based field effect transistors for ultimate scaling" 5 (5): 2437-2441, 2013

      2 E. J. Nowak, "Turning silicon on its edge [double gate CMOS/FinFET technology]" 20 (20): 20-31, 2004

      3 M. Bohr, "The evolution of scaling from the homogeneous era to the heterogeneous era" 1-1, 2011

      4 "Sentaurus, ver. M-2016"

      5 "Sentaurus Application note, [Online]"

      6 D. E. Nikonov, "Overview of beyond-CMOS devices and a uniform methodology for their benchmarking" 101 (101): 2498-2533, 2013

      7 "ITRS 2.0 2015, Beyond CMOS, [Online]"

      8 Y. Taur, "Fundamental of Modern VLSI Devices" Cambridge Univ. Press 2013

      9 R. Huang, "Challenges of 22 nm and beyond CMOS technology" 52 (52): 1491-1533, 2009

      10 H. M. Fahad, "Are nanotube architectures more advantageous than nanowire architectures for field effect transistors?" 2 (2): 2012

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2018-05-01 평가 SCOPUS 등재 (기타) KCI등재
      2016-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
      2014-01-21 학회명변경 영문명 : The Institute Of Electronics Engineers Of Korea -> The Institute of Electronics and Information Engineers
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0 0 0
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
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