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https://www.riss.kr/link?id=O40220352
1997년
eng
0179-0609
학술저널
PTB BERICHT F- PHYSIKALISCH TECHNISCHE BUNDESANTALT FERTIGUNGSMESSTECHNIK
32-39 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
3897010828
Quantitative microscopy
Seminar; 2nd
Geometrical measurements in the micro- and nanometre range with far and near field methods
Vienna
1997; Nov
0
상세조회0
다운로드
Topography measurements on silicon wafers by Scanning Force Microscopy (SFM)
Measurement of coating thickness on cross-sections by SEM
Simultaneous measurements of local electrical properties by a Scanning Probe
Software methods for calibration and correction of the SPM scanner