Creep behavior of solder ball in electronic packaging is one of the main concerns. Solder alloy can reach 50% of its melting point easily when application is operated. As a result, manufacturers should consider solder creep because creep behavior is d...
Creep behavior of solder ball in electronic packaging is one of the main concerns. Solder alloy can reach 50% of its melting point easily when application is operated. As a result, manufacturers should consider solder creep because creep behavior is dominant over 0.4Tm of solder alloy. In this research, we made quarter model of ball-grid-array electronic package through finite element analysis. Simulation cases consisted of 9 cases according to solder ball position arrangement, and creep analysis was performed with a cycle of thermal profile -45℃ ~125℃. Therefore, we suggested which case is the optimum arrangement for creep fatigue life and mechanical reliability of ball-grid-array packaging.