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https://www.riss.kr/link?id=O136374543
2022년
eng
1530-4388
1558-2574
SCIE;SCOPUS
학술저널
IEEE transactions on device and materials reliability
469-476 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0
상세조회0
다운로드
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling
STATE: A Test Structure for Rapid and Reliable Prediction of Resistive RAM Endurance
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM