Scheduling of semiconductor test facilities has been crucial since effective scheduling contributes to the profits of semiconductor enterprises and enhances the quality of semiconductor products. This study aims to solve the scheduling problems for th...
Scheduling of semiconductor test facilities has been crucial since effective scheduling contributes to the profits of semiconductor enterprises and enhances the quality of semiconductor products. This study aims to solve the scheduling problems for the wafer burn-in test facilities of the semiconductor back-end process by utilizing simulation and deep reinforcement learning-based methods. To solve the scheduling problem considered in this study. we propose novel state, action, and reward designs based on the Markov decision process. Furthermore, a neural network is trained by employing the recent RL-based method, named proximal policy optimization. Experimental results showed that the proposed method outperformed traditional heuristic-based scheduling techniques, achieving a higher due date compliance rate of jobs in terms of total job completion time.