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Testing-Based Failure Analysis: A Critical Component of the SIA Roadmap Vision
Maly, W. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.3-8
Experimental Figures for the Defect Coverage of I~D~D~Q Vectors
Clemminck, I. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.9-14
Experimental Figures for the Defect Coverage of I~D~O~Q Vectors
Clemminck, I.; Swerts, U.; Darquennes, M.; Van Sas, J. ASM International 1997 p.9-14
A CAD-Based Approach to Failure Diagnosis of CMOSLSI with Single Fault Using Abnormal I~D~D~O
Sanada, M. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.15-24
A CAD-Based Approach to Failure Diagnosis of CMOSLSI with Single Fault Using Abnormal I~D~D~Q
Sanada, M. ASM International 1997 p.15-24
Test and Failure Analysis Implications of a Novel Inter-Bit Dependency in a Non-Volatile Memory
Boyne, D. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.25-30
Analysis of a Latent Deep Submicron CMOS Device Isolation Leakage Mechanism
Sur, H. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.31-40
Scanning Fluorescent Microthermal Imaging
Barton, D. L. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.41-50
Fiege, G. M. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.51-56
Thermal and Optical Enhancements to Liquid Crystal Hot Spot Detection Methods
Ferrier, S. AMERICAN TECHNICAL PUBLISHERS LTD 1997 p.57-62