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https://www.riss.kr/link?id=O39299396
1997년
eng
0040-6090
1879-2731
SCI;SCIE;SCOPUS
학술저널
THIN SOLID FILMS
9-15 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
Recent developments in electron microscopy and X-ray diffraction of thin film structures
Symposium C
Strasbourg; France
1997; Jun
0
상세조회0
다운로드
Strain analysis by X-ray diffraction
New X-ray diffraction method for materials science
Combined high resolution X-ray diffraction and EXAFS studies of Si~(~1~-~x~)Ge~x heterostructures
HR XRD for the analysis of ultrathin centrosymmetric strained DB-RTD heterostructures