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https://www.riss.kr/link?id=O38825626
1998년
eng
1012-0394
1662-9779
학술저널
DIFFUSION AND DEFECT DATA PART B SOLID STATE PHENOMENA
75-80 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
3908450438
Polycrystalline semiconductors
International conference; 5th
Polycrystalline semiconductors 5; Polycrystalline semiconductors five
Schwabisch Gmund; Germany
1998; Sep
0
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Atomic Structure and Properties of Extended Defects in Silicon
Electrical Activity of Tilt and Twist Grain Boundaries in Silicon
Computer Simulation of Impurity Diffusion in the Vicinity of Grain Boundaries
Impurity Effect on the Dislocation DLTS Spectrum in Silicon