The effects of grain size and recrystallization on the tensile behavior of cryorolled pure vanadium were investigated. During equal channel angular pressing, the grain size was reduced from 100μm to 0.2μm in lamellar thickness; it was further re...
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https://www.riss.kr/link?id=A107592754
2009
-
SCOPUS,SCIE
학술저널
253-258(6쪽)
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
The effects of grain size and recrystallization on the tensile behavior of cryorolled pure vanadium were investigated. During equal channel angular pressing, the grain size was reduced from 100μm to 0.2μm in lamellar thickness; it was further re...
The effects of grain size and recrystallization on the tensile behavior of cryorolled pure vanadium were investigated. During equal channel angular pressing, the grain size was reduced from 100μm to 0.2μm in lamellar thickness; it was further reduced to 0.14μm by an additional 60% cryorolling. The grain refinement was accompanied by enhancing the yield strength by 30%. Upon annealing, the cryorolled vanadium showed a gradual decrease of yield strength with increasing grain size, in accordance with the Hall-Petch (H-P) relation. The yield strengths of the unrecrystallized vanadium, however, were higher by about 50MPa, than those expected by extrapolation of the Hall-Petch relation determined from the recrystallized samples. In the recrystallized condition, the tensile ductility of vanadium decreased gradually with a decrease in grain size to 1μm, but further reduction in grain size had little influence on ductility. The insensitivity of ductility to the grain size below 1μm apparently resulted from the counter-balancing effects of the reduced hardening capacity and increased hardening sources.
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