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Design and Test: What Will It Take to Tie the Knot?
Costello, J. B. INTERNATIONAL TEST CONFERENCE 1993 p.18
Automotive Industry: The Next DFT Challenge
Ledford, M. S. INTERNATIONAL TEST CONFERENCE 1993 p.19
A Universal Framework for Managed Built-in Test
Maunder, C. INTERNATIONAL TEST CONFERENCE 1993 p.21
The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis
Simpson, W. INTERNATIONAL TEST CONFERENCE 1993 p.30
The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis
Simpson, W.;Sheppard, J. IEEE 1993 p.30-36
Experience in Diagnosing a Remote, Tele-Controlled Unit Using the AITEST Expert System
Beniaminy, I. INTERNATIONAL TEST CONFERENCE 1993 p.37
Experience in Diagnosing a Remote, Tele-Controlled Unit Using the AITEST Expert System
Beniaminy, I.;Ben-Bassat, M.;Bodenheimer, M.;Eshel, M. IEEE 1993 p.37-44
System Level Interconnect Test in a Tristate Environment
Angelotti, F. INTERNATIONAL TEST CONFERENCE 1993 p.45