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A Structured Approach for the Systematic Test of Embedded Automotive Communication Systems
Armengaud, E.; Rothensteinera, F.; Steiningera, A.; Palliererb, R.; Horauerc, M.; Zaunerc, M. unknown 2005 p.1-8
Collins, P.; Reis, I.; Simonen, M.; van Houcke, M. unknown 2005 p.9-16
Definitions Of Jitter Measurement Terms And Relationships
Zamek, I.; Zamek, S. unknown 2005 p.25-34
Jitter Transformations In Measurement Instruments And Discrepancies Between Measurement Results
Zamek, I.; Zamek, S. unknown 2005 p.35-44
A New Measurement and Analysis Method for A Third Order Phase Locked Loop (PLL) Transfer Function
Ma, J.; Li, M.; Marlett, M. unknown 2005 p.56-65
A 16-bit Resistor String DAC with Full-Calibration at Final Test
Parthasarathy, K.; Kuyel, T.; Yu, Z.; Chen, D.; Geiger, R. unknown 2005 p.66-75
Power-Scan Chain: Design for Analog Testability
Zjajo, A.; Bergveld, H. J.; Schuttert, R.; de Gyvez, J. P. unknown 2005 p.76-83
A Self-Timed Structural Test Methodology for Timing Anomalies due to Defects and Process Variations
Singh, A. D. unknown 2005 p.84-90