1 "http://www.edmundoptics.com/optics/optical-lenses/ball-condenser-lense s/n-bk7-half-ball-lenses/49567/"
2 L. Yu, "Wavelength-scanning digital interference holography for tomographic three-dimensional imaging by use of the angular spectrum method" 30 (30): 2092-2094, 2005
3 B.M. Kim, "Visual inspection of 3-D surface and refractiveindex profiles of microscopic lenses using a single-arm off-axis holographic interferometer" 24 (24): 10326-10344,
4 K.B. Seo, "Three-dimensional visual inspection of nanoscale defects of transparent materials based on a modified lateral shearing interferometer" 357-358, 2014
5 L. Xu, "Studies of digital microscopic holography with applications to microstructure testing" 49 (49): 5046-5051, 2001
6 E. Cuche, "Spatial filtering for zero-order and twin-image elimination in digital off-axis holography" 39 (39): 4070-4075, 2000
7 B.M. Kim, "Single-shot digital holographic microscopy with a modified lateral-shearing interferometer based on computational telecentricity" 2017
8 Raul Castañeda, "Single-shot 3D topography of reflective samples with digital holographic microscopy" 57 (57): A12-A18, 2018
9 C. Falldorf, "Shearing interferometer based on the birefringent properties of a spatial light modulator" 34 (34): 2727-2729, 2009
10 M.A. Schulze, "Semiconductor wafer defect detection using digital holography" 5041 : 183-193, 2003
1 "http://www.edmundoptics.com/optics/optical-lenses/ball-condenser-lense s/n-bk7-half-ball-lenses/49567/"
2 L. Yu, "Wavelength-scanning digital interference holography for tomographic three-dimensional imaging by use of the angular spectrum method" 30 (30): 2092-2094, 2005
3 B.M. Kim, "Visual inspection of 3-D surface and refractiveindex profiles of microscopic lenses using a single-arm off-axis holographic interferometer" 24 (24): 10326-10344,
4 K.B. Seo, "Three-dimensional visual inspection of nanoscale defects of transparent materials based on a modified lateral shearing interferometer" 357-358, 2014
5 L. Xu, "Studies of digital microscopic holography with applications to microstructure testing" 49 (49): 5046-5051, 2001
6 E. Cuche, "Spatial filtering for zero-order and twin-image elimination in digital off-axis holography" 39 (39): 4070-4075, 2000
7 B.M. Kim, "Single-shot digital holographic microscopy with a modified lateral-shearing interferometer based on computational telecentricity" 2017
8 Raul Castañeda, "Single-shot 3D topography of reflective samples with digital holographic microscopy" 57 (57): A12-A18, 2018
9 C. Falldorf, "Shearing interferometer based on the birefringent properties of a spatial light modulator" 34 (34): 2727-2729, 2009
10 M.A. Schulze, "Semiconductor wafer defect detection using digital holography" 5041 : 183-193, 2003
11 S.G. Kim, "Removal of bias and the conjugate image in incoherent on-axis triangular holography and real-time reconstruction of the complex hologram" 36 (36): 4784-4791, 1997
12 W. Qu, "Quasi-physical phase compensation in digital holographic microscopy" 26 (26): 2005-2011, 2009
13 D. Nyyssonen, "Lens testing with a simple wavefront shearing interferometer" 12 (12): 2061-2070, 1973
14 J.W. Goodman, "Digital image formation from electronically detected holograms" 11 : 77-79, 1967
15 K.B. Seo, "Digital holographic mocroscopy based on a modified lateral shearing interferometer for three-dimensional visual inspection of nanoscale defects on transparent objects" 9 (9): 471-, 2014
16 E. Sánchez-Ortiga, "Digital holographic microscopy with pure-optical spherical phase compensation" 28 (28): 1410-1417, 2011
17 P. Ferraro, "Compensation of the inherent wave front curvature in digital holographic coherent microscopy for quantitative phase-contrast imaging" 42 (42): 1938-1946, 2003
18 A. Doblas, "Accurate single-shotquantitative phase imaging of biological specimens with telecentric digital holographic microscopy" 19 (19): 046022-, 2014