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Layer Thickness Effect on the Plasmon Dispersion Relation in a GaAs-Al_xGa_(1-x)As Superlattice(Type 1)

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https://www.riss.kr/link?id=A19624927

저자

LEE, Yong-Inn (Department of Physics and Semiconductor Physics Research Center, Chonbuk National University)
발행기관
全北大學校基礎科學硏究所
학술지명
基礎科學
권호사항

Vol.16 No.- [1994]
발행연도
1994
작성언어
English
KDC
409.000
자료형태
학술저널
수록면

183-188(6쪽)
제공처
RISS
소장기관
- 연세대학교 학술문화처 도서관
- 연세대학교 학술문화처 도서관

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다국어 초록 (Multilingual Abstract)

A hydrodynamic model is used to determine the finite thickness effect of the electron layers on the plasmon dispersion relation for the GaAs-Al_xGa_1-xAs superalattice. Although the model, which includes the layer thickness, gives only small changes from the zero-thickness (two-dimensional) model, it is just enough to remove the discrepancy between the theory based on the two-dimensional model and experiment. Assuming that the main damping mechanism for the linewidth broadening of transmission spectrocopy is collisional, the result of this work can be applied to find the resistivity of semiconductor superlattices without probing by the Helicon wave propagation method.

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A hydrodynamic model is used to determine the finite thickness effect of the electron layers on the plasmon dispersion relation for the GaAs-Al_xGa_1-xAs superalattice. Although the model, which includes the layer thickness, gives only small changes f...

A hydrodynamic model is used to determine the finite thickness effect of the electron layers on the plasmon dispersion relation for the GaAs-Al_xGa_1-xAs superalattice. Although the model, which includes the layer thickness, gives only small changes from the zero-thickness (two-dimensional) model, it is just enough to remove the discrepancy between the theory based on the two-dimensional model and experiment. Assuming that the main damping mechanism for the linewidth broadening of transmission spectrocopy is collisional, the result of this work can be applied to find the resistivity of semiconductor superlattices without probing by the Helicon wave propagation method.