Local structural and Magnetic Properties of Zn1-x MnxTe Semiconductor Films

다국어 초록 (Multilingual Abstract)

We investigated the local structural properties around the Zn and the Mn atoms of Zn1-xMnxTe (ZMT) magnetic semiconductor films (x = 0.16 and 0.27) by using the X-ray absorption fine struc- ture (XAFS). The ZMT lms were synthesized with a hot-wall epitaxy process. The XAFS mea- surements at the Zn K edge revealed that the ZMT films had an ordered zinc-blende structure and that no distinguishable structural disorder existed in any atomic pair independent of the Mn composition ratio. The XAFS analysis at the Mn K edge demonstrated that the Mn ions had a chemical valence state of 2+ and that they were exactly substituted at the Zn site. DC magnetiza- tion measurements from the specimens did not show a ferromagnetic property in the temperature range of 5 ∼ 300 K.

참고문헌 (Reference)

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