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https://www.riss.kr/link?id=O43609862
2005년
eng
1550-5774
2377-7966
SCOPUS
학술저널
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS
380-388 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0769524648 (pbk.)
Defect and fault tolerance in VLSI systems; DFT 2005
20th:; INTERNATIONAL SYMPOSIUM
Monterey, CA
2005; Oct
0
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Defects, Yield, and Design in Sublithographic Nano-electronics
An ILP Formulation for Yield-driven Architectural Synthesis
Design and Analysis of Self-repairable MEMS Accelerometer
Low Power BIST Based on Scan Partitioning