1 "Star-Hspice Manual"
2 J. -Y. Kim, "RF extraction method for source/drain overlap and depletion length of deep-submicron RF MOSFETs using intrinsic gate-bulk capacitance" 46 (46): 1566-1568, 2010
3 김종혁, "Nano-Scale MOSFET의 게이트길이 종속 차단주파수 추출" 대한전자공학회 42 (42): 741-748, 2005
4 차지용, "MOSFET의 RF 성능 최적화를 위한 단위 게이트 Finger 폭에 대한 fT 및 fmax의 종속데이터 분석" 대한전자공학회 45 (45): 21-25, 2008
5 N. Arora, "MOSFET Modeling for VLSI Simulation" World Scientific 2007
6 Seong-Hearn Lee, "Large-Signal MOSFET Modeling and Parameter Extraction for High-Frequency IC Design" SK텔레콤 12 (12): 130-137, 2002
7 H. -J Lee, "Extraction method for non-quasi-static gate resistance of RF MOSFETs" 48 (48): 1501-1503, 2012
8 "BSIM4.8.0 MOSFET Model Manual"
9 S. Lee, "Accurate RF extraction method for resistances and inductances of sub-0.1㎛ CMOS transistors" 41 (41): 1325-1327, 2005
10 Ju-Young Kim, "Accuracy Analysis of Extraction Methods for Effective Channel Length in Deep-Submicron MOSFETs" 대한전자공학회 11 (11): 129-133, 2011
1 "Star-Hspice Manual"
2 J. -Y. Kim, "RF extraction method for source/drain overlap and depletion length of deep-submicron RF MOSFETs using intrinsic gate-bulk capacitance" 46 (46): 1566-1568, 2010
3 김종혁, "Nano-Scale MOSFET의 게이트길이 종속 차단주파수 추출" 대한전자공학회 42 (42): 741-748, 2005
4 차지용, "MOSFET의 RF 성능 최적화를 위한 단위 게이트 Finger 폭에 대한 fT 및 fmax의 종속데이터 분석" 대한전자공학회 45 (45): 21-25, 2008
5 N. Arora, "MOSFET Modeling for VLSI Simulation" World Scientific 2007
6 Seong-Hearn Lee, "Large-Signal MOSFET Modeling and Parameter Extraction for High-Frequency IC Design" SK텔레콤 12 (12): 130-137, 2002
7 H. -J Lee, "Extraction method for non-quasi-static gate resistance of RF MOSFETs" 48 (48): 1501-1503, 2012
8 "BSIM4.8.0 MOSFET Model Manual"
9 S. Lee, "Accurate RF extraction method for resistances and inductances of sub-0.1㎛ CMOS transistors" 41 (41): 1325-1327, 2005
10 Ju-Young Kim, "Accuracy Analysis of Extraction Methods for Effective Channel Length in Deep-Submicron MOSFETs" 대한전자공학회 11 (11): 129-133, 2011
11 김주영, "A “Thru-Short-Open” De-embedding Method for Accurate On-Wafer RF Measurements of Nano-Scale MOSFETs" 대한전자공학회 12 (12): 53-58, 2012