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https://www.riss.kr/link?id=O50515910
2008년
eng
학술저널
PROCEEDINGS OF THE EUROPEAN CONGRESS ON ELECTRON MICROSCOPY
273-274 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
9783540852285
European Microscopy Congress; EMC 2008
14th
Aachen, Germany
2008; Sep
0
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Direct observation of atomic defects in carbon nanotubes and fullerenes
Atomic studies on ferroelectric oxides by aberration corrected transmission electron microscopy
Dark-field electron holography for the measurement of strain in nanostructures and devices
Some device challenges towards the 22nm CMOS technology