평형점 주사탐침열현미경을 이용한 변형률에 따른 그래핀의 열전도도 변화 측정

다국어 초록 (Multilingual Abstract)

Recently, many studies for enhancing the thermoelectric performance by tuning the phonon dispersion and introducing the phonon scattering via nano-structuring have been reported. For example, simulations have predicted that the thermal conductivity of graphene can be tuned by strain. However, they have shown the contradictory results and the measurement results of thermal conductivity of strained graphene are hard to find. In this study, we experimentally measure the strain effect on the thermal conductivity of suspended graphene by utilizing the null point scanning thermal microscopy, which can directly apply the strain to the graphene and simultaneously measure the change of the spreading resistance which is inversely proportional to the thermal conductivity. The strain is applied to the graphene by pushing the thermocouple probe, whose T.C. junction is locally heated, to the center of the suspended graphene disk. The change of spreading resistance of the graphene is obtained by monitoring the temperature signals measured at T.C. junction and ultimately, we can observe the strain effect on the thermal conductivity of the graphene.

목차 (Table of Contents)

• Abstract
• 1. 서론
• 2. 이론
• 3. 실험과정
• 4. 실험 결과
• 5. 결론
• 참고문헌