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https://www.riss.kr/link?id=O37136050
1999년
eng
학술저널
INTERNATIONAL CONFERENCE ON MICROELECTRONICS DEVICES AND MATERIALS
65-70 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
961900017X
International conference on microelectronics, devices and materials; 35th international conference on microelectronics, devices and materials, and, Workshop on microsystems, MIDEM conference '99
35th
Ljubljana, Slovenia
1999; Oct
0
상세조회0
다운로드
Introducting IEEE 1149.4 Standard - A Feasibility Study
Design of Silicon Microstrip Test Detector Structures for Digital Mammography
Fabrication and Characterization of FOXFET Biased Microstrip Detector