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https://www.riss.kr/link?id=O36852124
1993년
eng
0890-1740
학술저널
INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS
175-184 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0871704986
ISTFA '93
19th International symposium for testing and failure analysis
Los Angeles; CA
1993; Nov
0
상세조회0
다운로드
Analysis of Thin Films and Interfaces by Angle-Lap Auger Depth Profilling
Microscopy Methods for Integrated Circuit Interconnect Evaluation
A Case History of Reduced Electromigration Time to Failure with Reduced Temperature
An Investigation of Steam Age Induced Crystal Growth on the Seal Glass of Ceramic Frit Packages