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      Synthesis of Silver Nanowires with Controllable Diameter and Simple Tool to Evaluate their Diameter, Concentration and Yield

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      https://www.riss.kr/link?id=O120042684

      • 저자
      • 발행기관
      • 학술지명
      • 권호사항
      • 발행연도

        2019년

      • 작성언어

        -

      • Online ISSN

        2365-6549

      • 등재정보

        SCOPUS;SCIE

      • 자료형태

        학술저널

      • 수록면

        2716-2720   [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]

      • 구독기관
        • 전북대학교 중앙도서관  
        • 성균관대학교 중앙학술정보관  
        • 부산대학교 중앙도서관  
        • 전남대학교 중앙도서관  
        • 인천대학교 학산도서관  
        • 숙명여자대학교 중앙도서관  
        • 서강대학교 로욜라중앙도서관  
        • 계명대학교 동산도서관  
        • 충남대학교 중앙도서관  
        • 한양대학교 백남학술정보관  
        • 이화여자대학교 중앙도서관  
        • 고려대학교 도서관  
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      부가정보

      다국어 초록 (Multilingual Abstract)

      Simple solvothermal method was used to synthesize of uniform silver nanowires with the controllable diameter (17, 20, 35, 70 and 100 nm). It is the first report on the solvothermal synthesis of ultra‐thin silver nanowires (17 nm) with the high aspect ratio (>1000). Knowing silver nanowires diameter, length and yield after synthesis are a critical step to classify them for the final goal. Up to now, although the length of nanowires can be measured with the optical microscope, but to estimate the diameter, costly high‐resolution microscopic techniques are necessary. Herein, UV/Vis spectroscopy as an easy and cost‐effective tool is introduced to evaluate the diameter and yield of nanowires. For this purpose, after synthesis and purification of silver different nanowires; from their UV/Vis spectra, a new equation for evaluation nanowires diameter was extracted. In addition, for the first time, absorption coefficients (ϵ) of nanowires with different diameter thickness were reported and a new equation to estimate absorption coefficients to calculate concentration (mg/ml) and yield of silver nanowires was extracted. These equations have good agreement with real data and are independent of the length of nanowires.
      UV/Vis spectroscopy can be used to estimate the diameter, concentration and yield of silver nanowires suspensions. It is simple, fast and cost effective tool that can be replaced with expensive high resolution SEM and TEM microscopic techniques that are not available in most research laboratories.
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      Simple solvothermal method was used to synthesize of uniform silver nanowires with the controllable diameter (17, 20, 35, 70 and 100 nm). It is the first report on the solvothermal synthesis of ultra‐thin silver nanowires (17 nm) with the high a...

      Simple solvothermal method was used to synthesize of uniform silver nanowires with the controllable diameter (17, 20, 35, 70 and 100 nm). It is the first report on the solvothermal synthesis of ultra‐thin silver nanowires (17 nm) with the high aspect ratio (>1000). Knowing silver nanowires diameter, length and yield after synthesis are a critical step to classify them for the final goal. Up to now, although the length of nanowires can be measured with the optical microscope, but to estimate the diameter, costly high‐resolution microscopic techniques are necessary. Herein, UV/Vis spectroscopy as an easy and cost‐effective tool is introduced to evaluate the diameter and yield of nanowires. For this purpose, after synthesis and purification of silver different nanowires; from their UV/Vis spectra, a new equation for evaluation nanowires diameter was extracted. In addition, for the first time, absorption coefficients (ϵ) of nanowires with different diameter thickness were reported and a new equation to estimate absorption coefficients to calculate concentration (mg/ml) and yield of silver nanowires was extracted. These equations have good agreement with real data and are independent of the length of nanowires.
      UV/Vis spectroscopy can be used to estimate the diameter, concentration and yield of silver nanowires suspensions. It is simple, fast and cost effective tool that can be replaced with expensive high resolution SEM and TEM microscopic techniques that are not available in most research laboratories.

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