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https://www.riss.kr/link?id=O39692473
1996년
eng
0142-2421
1096-9918
SCI;SCIE;SCOPUS
학술저널
SURFACE AND INTERFACE ANALYSIS
510-513 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
Development and industrial application of scanning probe microscopy; Papers presented at the SXM 2 workshop, Vienna, Austria, 16-18 September 1996
Workshop; 2nd
Vienna
1996; Sep
0
상세조회0
다운로드
Scanning Near-field Magneto-optic Microscopy: Quantitative Measurements of Local Faraday Effects
Fractal Dimension of Thin-film Surfaces Obtained by Fourier Spectral Analysis
Spectroscopic Contrast by Color Photon Scanning Tunnelling Microscopy