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https://www.riss.kr/link?id=O39077860
1996년
eng
학술저널
SYMPOSIA PROCEEDINGS- EUROPEAN MATERIALS RESEARCH SOCIETY
48-52 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
044420508X
New developments on porous silicon: relation with other nanostructured porous materials
Symposium L
Thin solid films
Strasbourg; France
1996; Jun
0
상세조회0
다운로드
Analysis of the depth homogeneity of p-PS by reflectance measurements
Visual determination of thickness and porosity of porous silicon layers
Raman scattering and luminescence polarization anisotropy in porous Si
Characterization of porous silicon by Raman scattering and photoluminescence